On the weak spot concept in the dielectric breakdown of thin polymer films

Films were prepared in a low-frequency (2.5-kHz) glow discharge diode system from hexamethyldisiloxane vapors at a pressure of 0.25 torr. Ramp and step tests were carried out to obtain voltage breakdown data. Statistical analysis of the weak-spot breakdown data shows that dielectric information can be extracted from their field functional dependence. As a consequence, these data cannot be considered as an extrinsic artefact but rather as a property of the film itself.<
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