Reducing embedded software radiation-induced failures through cache memories

Cache memories are traditionally disabled in space-level and safety-critical applications, since it was believed that the sensitive area they introduce would compromise the system reliability. As technology has evolved, the speed gap between logic and main memory has increased in such a way that disabling caches slows the code much more than in the past. As a result, the processor is exposed for a much longer time in order to compute the same workload. In this paper we demonstrate that, on modern embedded processors, enabling caches may bring benefits to critical systems: the larger exposed area may be compensated by the shorter exposure time, leading to an overall improved reliability. We describe the Mean Workload Between Failures, an intuitive metric to evaluate the impact of enabling caches for a given generic application error rate. The proposed metric is experimentally validated through an extensive radiation test campaign using a 28 nm off-the-shelf ARM-based SoC as a case study. The failure probability of the bare-metal application is decreased when the L1 cache is enabled but increased when L2 is also enabled. We also discuss when L2 caches could make the device more reliable.