A $148fs_{rms}$ Integrated Noise 4 MHz Bandwidth Second-Order $\Delta\Sigma$ Time-to-Digital Converter With Gated Switched-Ring Oscillator

This paper presents a second-order ΔΣ time-to-digital converter (TDC) by using a switched-ring oscillator (SRO) and a gated switched-ring oscillator (GSRO). Unlike conventional multi-stage noise-shaping (MASH) TDC using SROs, the proposed TDC does not require complex calibration to compensate for the error from frequency difference between the oscillators. Furthermore, the performance of the proposed TDC is analyzed, including non-idealities such as phase noise, mismatch, and PVT variations. The prototype 1-1 MASH TDC achieves 148 f s
_rms
integrated noise in 4 MHz signal bandwidth at 400 MS/s while consuming 6.55 mW in a 65 nm CMOS process.