Large Area ${\rm Cd}_{0.9}{\rm Zn}_{0.1}{\rm Te}$ Pixelated Detector: Fabrication and Characterization

Cd
_0.9
Zn
_0.1
Te (CZT) based pixelated radiation detectors have been fabricated and characterized for gamma ray detection. Large area CZT single crystals has been grown using a tellurium solvent method. A 10 ×10 guarded pixelated detector has been fabricated on a ~ 19.5 ×19.5 ×5 mm
³
crystal cut out from the grown ingot. The pixel dimensions were 1.3 ×1.3 mm
²
and were pitched at 1.8 mm. A guard grid was used to reduce interpixel/inter-electrode leakage. The crystal was characterized in planar configuration using electrical, optical and optoelectronic methods prior to the fabrication of pixelated geometry. Current-voltage (I-V) measurements revealed a leakage current of 27 nA at an operating bias voltage of 1000 V and a resistivity of ~ 3.1 ×10
¹⁰
Ω-cm. Infrared transmission imaging revealed an average tellurium inclusion/precipitate size less than 8 μm. Pockels measurement has revealed a near-uniform depth-wise distribution of the internal electric field. The mobility-lifetime product in this crystal was calculated to be 6.2 ×10
^{- 3}
cm
²
/V using alpha ray spectroscopic method. Gamma spectroscopy using a
¹³⁷
Cs source on the pixelated structure showed fully resolved 662 keV gamma peaks for all the pixels, with percentage resolution (FWHM) as high as 1.8%.