Insulation characteristics of epoxy insulator with internal delamination-shaped micro-defects

The degradation characteristic of solid insulators is considered to be one of the key factors to perform a risk assessment of highly aged gas insulated switchgear (GIS). The present study experimentally obtained the insulation characteristics of epoxy insulator mainly with an internal microscopic delamination-shaped defect. In the experiment, a short-time breakdown electric field (EF) was initially obtained and comparison was made with the breakdown EF for the void and crack defects to evaluate the breakdown risk with respect to the defect shape. These defect models (delamination, void, and crack) were designed and produced so that an apparent partial (PD) might be 1 pC in an actual 550 kV-GIS spacer. Consequently, it emerged that the area where the EF was concentrated influenced the breakdown. Of the three types of defect, the degree of EF concentration was the lowest for delamination defects, meaning the lowest breakdown risk for the same. Subsequently, the V-t characteristics were obtained through an EF acceleration test. The V-t characteristics obtained were extrapolated to estimate the breakdown risk in 30 to 50 years operation, which is considered the design life of GIS. As a result, it was determined that the potential for eventual breakdown was extremely low under the normal operating EF, even if a delamination defect equivalent to an apparent PD of 1 pC was present in an actual 550 kV-GIS spacer. Hence, controlling a defect using 1 pC for actual GIS is considered to ensure reliability under long-term operation.