Application of the characteristic basis function pattern method to reflector surface inaccuracies and sidelobe modeling

The Characteristic Basis Function Pattern Method (CBFPM) is applied to compensate for pattern variations that result from surface inaccuracies in a dual-reflector antenna system. Toward evaluating the efficiency of this pattern modeling technique in a realistic environment, the impact of noise in calibration measurements required to solve for the pattern model, as well as that of calibration measurements in non-ideal directions, are considered.