Optical measurements based on RF modulation techniques

A characterization concept is introduced for high-speed lightwave components based on high-frequency RF modulation of the test signals. The concept is explained by using the example of optical transmission measurements covering optical loss, modulation bandwidth, and length measurements. Optical reflection measurements are investigated with the capability of separating multiple reflections. Responsivity measurements of electrooptical devices such as lasers and photodiodes are investigated. The described concepts are utilized in the first commercially available instrumentation systems covering a modulation bandwidth up to 20 GHz.<
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