A fully digital controlled off-chip I/sub DDQ/ measurement unit

The paper describes a new Digital controlled Off-Chip I/sub DDQ/ Measurement Unit (DOCIMU), which provides reliable precision and relatively fast measurements, even with a high capacitive load, while the Device Under Test (DUT) is unaffected. The maximal resolution is 50 nA and the accurate measurement range is 1 mA. Unlike other I/sub DDQ/ monitors, the DOCIMU copes with external interference, as it needs no analogue pin to set the I/sub DDQ/ limit and the noise at the V/sub DD/ is eliminated via a special S/H feature. The DOCIMU is also a testable I/sub DDQ/ monitor, which is another unique feature.