Variability Analysis of Interconnects Terminated by General Nonlinear Loads

A stochastic modeling method is presented for the analysis of variability effects, induced by the manufacturing process, on interconnect structures terminated by general nonlinear loads. The technique is based on the solution of the pertinent stochastic Telegrapher's equations in time domain by means of the well-established stochastic Galerkin method, but now allows, for the first time in the literature, the inclusion of loads with arbitrary I-V characteristics at the terminals of the lines. The transient solution is obtained by combining the stochastic Galerkin method with a finite-difference time-domain scheme. The proposed technique is validated and illustrated with a meaningful application example, demonstrating its accuracy and efficiency.