Mapping high-pressure Bridgman Cd/sub 0.8/Zn/sub 0.2/Te

Single crystals of Cd/sub 0.8/Zn/sub 0.2/Te grown at the Institute of Solid State Physics, Chernogolovka, Russia, by the high-pressure vertical Bridgman method (HPVB) were mapped using X-ray fluorescence (XRF), X-ray diffraction (XRD), photoluminescence (PL), and leakage current measurements, most of the Russian samples which we refer to as p-type CZT were more uniform in Zn composition than U.S. commercially produced material. The Russian material had a poorer crystallinity and, in the best case, could only count nuclear radiation. Differences in the material properties between Russian (p-type) and U.S. (n-type) material will be described.