Call for papers: Special Issue on Variability and Aging

IEEE Design & Test of Computers seeks original manuscripts for a special issue on the "Variability and Aging" topic, scheduled for publication in November/December 2013. This special issue will cover recent works on variability and aging, including modeling circuit techniques, and innovative monitoring and countermeasure mechanisms at the circuit, micro-architectural, and system level to mitigate variability and improve reliability.