Edge diffraction in the scattering of focused terahertz radiation

The terahertz (THz) near-field microscope is a powerful diagnostic test instrument for nanotechnology, allowing of measuring of spectral characteristics of objects much less than the THz wavelength. It is based on the processes of interaction between THz electric field and an object situated in the very presence of the scanning probe microscope (SPM) probe. These processes are specified by the interaction of the nanoobject under test with the near-field component of the electric field near the tip of the SPM probe which is illuminated by broadband coherent THz pulses.