The Instrument Bandwidth Effect in Jitter and BER Test for High-Speed Serial Interconnection

Different from other electronics measurement, the bandwidth of the instrument can affect the test results more seriously in jitter and bit-error rate (BER) test. This paper analyzes the effect on the jitter and BER test results caused by instrument bandwidth in high-speed serial interconnection. An algorithm is presented to measure and estimate the equivalent frequency response of instruments. Computed data-dependent jitter (DDJ) results are produced based on the
S
-parameter of the serial interconnected channels and the equivalent frequency response of instruments, which are perfectly consistent with actual DDJ measure results. These methods can be used to measure and calibrate the instrument bandwidth effect precisely in jitter and BER test. At last, the paper gives the results of the instrument bandwidth effect for three channels and a set of instruments according to simulation, and presents a new concept “equivalent bandwidth” to roughly estimate the test error of DDJ caused by instrument bandwidth.