Software in the Loop environment reliability for testing embedded code

This paper makes an analysis of the Software in the Loop (SiL) environment reliability for testing embedded system algorithms. The embedded system used during this analysis was developed around a C167CR microcontroller and based on a real-time (RT) operating system (OS). The main function of the control algorithm implemented into the embedded system is to control the speed of a DC motor. The embedded system software was wrapped into a SiL environment where the real-time operating system and the low level drivers where emulated. The obtained results where compared with the ones from Hardware in the Loop (HiL) testing system. Several aspects were followed during analysis: accuracy of the obtained results, proper functioning of the emulated RT OS, the possibility of using the same tools over product life cycle and implementation of automated.