Testability modeling usage in design-for-test and product lifecycle cost reduction

Weapon systems have become increasingly complex and customer funding has become constricted. Customers and contractors are in an environment where the cost of test systems has to be reduced yet still test effectively in order to remain competitive. In an effort to reduce the total development and lifecycle cost, companies are using Design-For-Test (DFT) methodologies to increase Built-In-Test (BIT) coverage and reduce the need for external Special Test Equipment (STE). Using test coverage analysis tools during prime hardware design efforts has benefits including identification of gaps in test capability, increased test coverage, test strategy optimization, increased accessibility, fault isolation and a reduction in overall test cost.