Radiation effects on the AT&T CBIC linear bipolar process

Transistors and commercial operational amplifiers from the AT&T CBIC-R, CBIC-U2 and CBIC-V2 bipolar processes were tested to Co60 ionizing radiation. High and low rate Co60 dose rates were used along with various bias conditions. The data shows the CBIC-U2 process amplifiers to be tolerant to total ionizing dose of 10 Mrad(SiO/sub 2/). The CBIC-V2 amplifiers show minor effects at 100 krad(SiO/sub 2/). The CBIC-R amplifiers show significant loss of transresistance by 1 Mrad. Bandwidth and total harmonic distortion were checked pre-rad and post-rad and no degradation was found.