Characterization of single event effects for the AD677, 16-bit A/D converter

The AD677 demonstrated four types of single event effects (SEE): temporary data errors due to single event upsets (SEU) in the Analog die; temporary data errors due to SEU's in the Digital die; lingering data errors due to SEUs in the Digital die and a nondestructive, self-correcting latchup mode in the Digital die. This report presents the results.