Broadband performance of 110 GHz interconnects built in HRSi-based membrane technology

In this paper we characterize broadband low-loss interconnects built in membrane technology on highly-resistive silicon (HRSi) substrates. Test structures were fabricated and measured in a frequency range from 0.1 to 110 GHz. The measured propagation constant of the membrane CPW part of the interconnect agrees well with analytical calculations in the entire frequency band.