Nonlinear response of HTSC thin film microwave resonators in an applied DC magnetic field

The non-linear microwave surface impedance, Z/sub s/=R/sub s/+iX/sub s/, of patterned YBCO thin films, was measured using a suspended line resonator in the presence of a perpendicular DC magnetic field, H/sub DC/, of magnitude comparable to that of the microwave field, H/sub rf/. Signature of the virgin state was found to be absent even for relatively low microwave power levels. The microwave loss was initially found to decrease for small applied H/sub DC/ before increasing again. Also, non-linearities inherent in the sample were found to be substantially suppressed at low powers at these applied fields. These two features together can lead to significant improvement in device performance.