Simulation and implementation of lightwave component characterization using a bilateral electro-optic network

The simulation and implementation of a bilateral electro-optic network has been demonstrated. The advantage of the proposed network is that it can be used as a black box to convert a microwave network analyzer into a two-port lightwave network analyzer. Simulations have been carried out to determine the sensitivity of the bilateral network to optical reflections. Measurement results on one-port optical structures are more accurate than those obtained with commercial lightwave analyzers and indicate the viability of this approach for full two-port lightwave measurements.