Reply to Comments on “A Novel Technique for Measuring One-Dimensional Permittivity Profiles Using a Simple Non-Commensurate Planar Structure”

This paper is reply to comment on "A Novel Technique for Measuring One-dimensional Permittivity Profiles Using a Simple Non-commensurate Planar Structure”. Commentator's claim that formula (1) of our paper is an approximate one and is valid only for low permittivity materials is correct. The error due to using formula (1) instead of the rigorous formula (6) shown by Ogunlade is within the measuring error, but it can become of several percent in case of high permittivity materials. The error, of course, increases not only with the permittivity of the MUT, but also when the length covered by the MUT approaches one half of the stub length, while it reduces to zero when the MUT covers the entire stub length.