A multibackground march test for all static simple neighborhood pattern-sensitive faults in RAMs

Based on all realistic static two-cell coupling faults presented by Hamdioui, van de Goor, and Rodgers in [1], we have defined a complex model of neighborhood pattern sensitive faults (NPSFs) in N × 1 random-access memories [2]. Thus, the large model of NPSFs we have considered (called all static NPSFs) includes state coupling faults, transition coupling faults, write disturb coupling faults, read destructive coupling faults, deceptive read destructive coupling faults, and incorrect read coupling faults. A new multibackground march test able to cover this large model of NPSFs is presented in this paper.