Built-In-Self-Test (BIST) probing for wireless non-contact measurement and characterization of integrated circuits and systems

This paper discusses concept and feasibility of wireless BIST probing for non-contact measurement and characterization. Inter-Chip noise interferences as function of wireless coupling-path attributes (wireless separation distance between emitter and receiver chips, injected power levels, Charge-Pump-Current) are characterized. Study of BIST for reconfigurability of on-chip functions is investigated based on design of programmable automatic oscillation amplitude control of PLL reference oscillators. Impacts of BIST circuits on system performances are evaluated based on simulation analysis and experimental verifications.