Arcing and voltage breakdown in vacuum microelectronics microwave devices using field emitter arrays: causes and possible solutions

Summary form only given. We review briefly the differences between conventional and microelectronics devices which impact field emitter array (FEA) performance. We then review recent progress and state of the art FEA performance, analyze a number of possible causes of failure and suggest methods, particularly coating FEAs with refractory carbides, in order to stabilize FEAs and achieve prolonged arc free operation at increased current level.