Terahertz Near-Field Microscope: Analysis and Measurements of Scattering Signals

We present the analysis and measurements of scattering signals of a terahertz pulse scattering-type near-field microscope. We used a self-consistent line dipole image method for the quantitative analysis of the THz near-field interaction. The line scan across a gold film demonstrated that the terahertz microscope has a nanoscale resolution of ~80 nm. The measurements of scattering signals on gold and silicon substrates were in good agreement with calculations.