Space charge characterization by the pressure pulse method in ion-irradiated polyimide films

The Pressure Pulse Method allows in situ measurements of charge build-up and evolution in heavy ion irradiated Kapton samples with a good signal to noise ratio. Space charge is detected in films with a thickness to range ratio larger or lower than one; in the latter case, ions are crossing throughout the material but a residual charge can be detected. The mean projected range in a thick sample,

, is determined with good accuracy at low fluence.