NBTI-aware statistical timing analysis framework

Negative bias temperature instability (NBTI) has become a major factor of reliability. In this paper, we proposed a simple analytical model to predict the degraded delay distribution due to NBTI and process variation. Using our NBTI and variation-aware timing analysis framework, accurate degraded gate delay is computed without tedious simulation. Moreover, conventional variation-aware design techniques can apply to develop a reliable circuit design using our model.