Sine-fit versus discrete Fourier transform-based algorithms in SNR testing of waveform digitizers

The performance of discrete Fourier transform (DFT)-based algorithms employed in signal-to-noise-ratio (SNR) testing of waveform digitizers is analyzed and compared to the performance obtained using sine-fit procedures. Theoretical results are recalled, emphasizing their relevance and importance. Evaluations based on experimental data, obtained by an 8-bit digitizing oscilloscope, show that the accuracies approaches are comparable, while in several respects the methods appear complementary, rather than alternative.