Design of TEM cell and high sensitive probe for EMI analysis of built-in Webcam module

Since many extremely susceptible components with low-voltage operation or high sensitivity may be affected from EMI noise and thus degrade their performance, the EMI phenomena from IC becomes an issue for semiconductor industry. In this paper, we have designed a TEM Cell and magnetic field probe with high sensitivity and spatial resolution, in accordance with the IC-EMI measurement standard IEC 61967-2 and IEC 61967-3 respectively. The goal is to setup a more accurate measurement of the noise source location and the corresponding frequency bands to analyze the platform noise effect. The operating frequency of TEM Cell has been raised up to 2.43 GHz. Two identical IC for Webcam module with some minor modifications were used for EMI measurement and further analysis for the interference effects.