Aliasing probability of hybrid linear feedback signature registers

Signature analysis techniques that use linear feedback shift register attract increasing attention in the field of IC testing. This paper shows the linkage between aliasing probability of hybrid design LFSR's and its own cycling sequences. We give the condition that the aliasing probability on a single input of hybrid type LFSR approaches a value greater than 2/sup -n/. Finally, we point out that the probabilistic behaviors of hybrid design of LFSR's and the normal design are the same under primitive realization.