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Pitfalls for CDM calibration procedures | IEEE Conference Publication | IEEE Xplore

Pitfalls for CDM calibration procedures


Abstract:

A product qualification gave very different results for CDM testing between 3 labs. This paper describes the investigation into the root cause of these differences. The m...Show More

Abstract:

A product qualification gave very different results for CDM testing between 3 labs. This paper describes the investigation into the root cause of these differences. The most relevant issues are the measurement bandwidth and the quality of the calibration modules. An improved procedure is proposed.
Date of Conference: 03-08 October 2010
Date Added to IEEE Xplore: 09 November 2010
CD:978-1-58537-182-2
Conference Location: Reno, NV, USA

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