Measurement, simulation and reduction of EOS damage by electrical fast transients on AC power

It is shown that electrical fast transients (EFT) on the AC power line can result in electrical overstress (EOS) damage to a Class 0 ESD sensitive device connected to the output of AC powered equipment. A methodology for measuring EFT and EOS transients is described and simulations are used to understand coupling mechanisms. Finally, several techniques for reduction of the EOS transient are tested and analyzed.