Miniature dual six-port millimeter-wave network analyzer on alumina ceramic substrate

This paper presents a dual six-port network analyzer suitable for the measurement of the reflection and the transmission coefficients of a device under test in the frequency band 59-61 GHz. The millimetre-wave part is implemented on a thin alumina ceramic substrate associated to non-biased Schottky diodes for power detection. The proposed system is realized and the different tests performed demonstrate the validity of this alternative for millimetre-wave measurements.