A simple transition response model for magnetoresistive heads on thin-film media

Using an analysis similar to that of Potter (1975), we develop a model to describe the transition response for magnetoresistive (MR) heads. The model developed is called the Lorentzian-gap model and includes the effects of shield gap length and MR element thickness. By bringing in a small frequency-independent phase shift, the left-right asymmetry of the transition response and baseline offset for isolated pulse measurements can be modeled. Applying the Lorentzian-gap model to geometrical parameters of the head-media system (HMS) results in a transition response which is close to the measured one. Further improvement of the modeling can be obtained by using the tanh transition model instead of the commonly used arctan model.