Reliability of modified designs: a Bayes analysis of an accelerated test of electronic assemblies

Accelerated tests on two similar assemblies suggest that their lifetimes are in excess of 30000 h. A Bayes approach to reliability estimation using life test data from the two assemblies and those from an earlier evaluation of a third assembly, similar to the two under study, is described. The Bayes approach permitted a reduction in the number of test samples, compared to the earlier evaluation. The reliability of the two new assemblies was comparable to or better than that of the older one.<
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