Tunable replica bits for dynamic variation tolerance in 8T SRAM

Infrequent dynamic events like V
_CC
droops and temperature changes result in the use of a static V
_CC
guard-band. Measured data on a 16KB 8T array featuring tunable replica bits illustrate the opportunity of eliminating a majority of the static guard-band in memory arrays, resulting in lower operating V
_CC
/power.