20nm gate length trigate pFETs on strained SGOI for high performance CMOS

We present the shortest and narrowest high-κ/metal gate n- and pFETs on compressively strained enriched SiGe On Insulator (c-SGOI) reported to date (L
_G
=20nm; W=30nm; T
_SiGe
=15nm). The range of active area widths in this work allows observing the transition from biaxial to uniaxial stress due to lateral elastic strain relaxation, and its benefit down to 20nm gate length on hole mobility and pFET performance (up to ×2.85 I
_Dlin
enhancement vs. SOI, I
_ON
=520μA/μm/I
_OFF
=130nA/μm at L
_G
=20nm and V
_DS
=-1V). Moreover, an improved electrostatic integrity compared to SOI pFETs is demonstrated in c-SGOI (DIBL=120mV/V vs. 160mV/V, respectively at L
_G
=30nm). Combined to the intrinsic |V
_th,p
| lowering properties of c-SiGe, these characteristics qualify trigate c-SGOI as a very promising candidate for high performance pMOSFETs.