An approach to the specification driven testing of analogue circuits

A fast method to test analogue circuits, featuring low testing cost is proposed here. The method is based on the properties of a set of parameters, /spl alpha//sub i/, easily measured by sampling in a few time points the circuit response to a rectangular pulse. Starting from the specifications defined on the circuit performances, it is possible to identify, via a statistical approach, the acceptability domain in the /spl alpha//sub i/ space. The faulty circuit is identified as its /spl alpha//sub i/ parameters do not belong to the acceptability region. The method was successfully applied to a second order low pass filter and to a CMOS load compensated Operational Transconductance Amplifier (OTA).