Efficient numerical technique for the analysis of the actual influence of a radiating element embedded in a reflectarray

In this paper, we present an efficient technique for the design refinement of a reflectarray by the characterization of the “actual” influence of each radiating element when embedded in the antenna structure. The method makes use of the MLayAIM, a fast full-wave formulation suitable for the analysis of electrically large multilayered printed arrays which have one or more planar metallizations and vertical conductors.