Integrated FDTD and solid-state device simulation

A mixed-mode circuit simulation technique is presented, based on the lumped-element finite-difference time-domain (FDTD) scheme. The algorithm is extended to incorporate numerical models of lumped devices. This makes the formulation and characterization of analytical, closed-form models for circuit devices unnecessary and allows for directly correlating device behavior and fabrication process parameters. The code is therefore especially suited for high-speed and microwave IC optimization.