High-resolution alpha spectrometry with a thin-window silicon carbide semiconductor detector

The potential for high-resolution alpha-particle energy spectrometry in high-temperature, high-radiation environments using thin-window 4H-SiC radiation detectors has been demonstrated.
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Pu alpha-particle peaks separated by only 42.7 keV have been completely resolved using a SiC Schottky detector with a 400 A¿ titanium Schottky contact (entrance window). The observed FWHM for the
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Pu 5499.2-keV alpha particle peak is 20.6 keV or 0.37%. Factors affecting the observed alpha-particle energy resolution in SiC detectors will be discussed.