An efficient algorithm for modeling spatially-correlated process variation in statistical full-chip leakage analysis

Statistical full-chip leakage analysis considering spatial correlation is highly expensive due to its O(N
²
) complexity for logic circuits with N gates. Although efforts have been made to reduce the cost at the loss of accuracy, existing methods are still unsuitable for large-scale problems. In this paper we resolve the problem by re-formulating the computation to one that can be done efficiently using a well-developed technique that has been widely used in fast EM simulation and machine learning areas. The resulting algorithm is provably of O(N) or O(N log N) complexity with well-defined and easily-controlled error bounds. Experiments show that using the proposed method it is feasible to handle million-gate circuits within only a few minutes on a regular desktop PC. The corresponding error is less than 0.5% compared to exhausted computation that takes more than 3 days. The proposed method is about 300× faster and 10× more accurate compared to existing grid-approximation method.