Development of a Versatile Test Platform for Single Event Effect (SEE) Characterization of Analog, Digital and Mixed-Signals Integrated Circuits (ICs)

This paper describes a versatile test platform developed by the Canadian Space Agency (CSA), relying on a configurable Digital Comparator and Analog Multitrig Unit (DCAMU), aimed at detecting and counting single-event effects (SEEs) for a variety of electronic devices under radiation testing.