Heavy Ion Testing and Single Event Upset Rate Prediction Considerations for a DICE Flip-Flop

Monte-Carlo simulation using the MRED software suite, coupled with SPICE analysis, is used to identify internal mechanisms of SEU in DICE flip-flops. Low frequency cross-section measurements and simulations identify multiple-node charge collection SEU mechanisms as the dominant contributor. An increasingly isotropic response is predicted with increasing frequency due to latching of internal single-node transients near clock boundaries. Implications for heavy ion testing and SEU rate prediction are presented.