The final barriers to widespread use of I/sub DDQ/ testing

I/sub DDQ/ testing is required for high quality products. Several barriers to I/sub DDQ/ testing have fallen. This is due to the rising importance of testing, quality, and CAD tool integration of design and test. Both theory and practice have demonstrated the value of I/sub DDQ/ testing methodologies. Three key issues still hinder widespread utilization of I/sub DDQ/. The first issue is how does I/sub DDQ/ compete with other test methods. The second issue is what measurement techniques can be used. And the third issue is how to set the I/sub DDQ/ current limit to catch defective parts without rejecting defect-free parts. The thesis of this presentation is that the issues are being actively worked, and the barriers will fall.