Transparent memory testing for pattern sensitive faults

This paper presents a new methodology for RAM testing based on PS(n, k) fault model (the k out of n pattern sensitive fault model). According to the model the contents of any memory cell which belongs to an n-bit memory block, or ability to change the contents, is influenced by the contents of any k-1 cells from this block. This paper includes the investigation of memory testing approaches based on the transparent pseudoexhaustive testing and its approximations by pseudorandom circular tests, which can be used for periodic and manufacturing testing and require lower hardware and time overheads than the standard approaches.