Enhanced Hole Transport in Short-Channel Strained-SiGe p-MOSFETs

Hole mobility and velocity are extracted from scaled strained-Si
_0.45
Ge
_0.55
channel p-MOSFETs on insulator. Devices have been fabricated with sub-100-nm gate lengths, demonstrating hole mobility and velocity enhancements in strained- Si
_0.45
Ge
_0.55
channel devices relative to Si. The effective hole mobility is extracted utilizing the
dR
/
dL
method. A hole mobility enhancement is observed relative to Si hole universal mobility for short-channel devices with gate lengths ranging from 65 to 150 nm. Hole velocities extracted using several different methods are compared. The hole velocity of strained-SiGe p-MOSFETs is enhanced over comparable Si control devices. The hole velocity enhancements extracted are on the order of 30%. Ballistic velocity simulations suggest that the addition of (110) uniaxial compressive strain to Si
_0.45
Ge
_0.55
can result in a more substantial increase in velocity relative to relaxed Si.