Microstructural effects in capacitive composition measurements

Capacitance-based sensors offer practical advantages for binary composition measurements in various manufacturing processes. The implications of the microstructure of binary mixtures in capacitive composition measurements are explored. Specifically, it is shown that microstructural assumptions can be used to derive measurement uncertainty bounds when inferring composition from measured capacitances. Worst-case bounds are obtained from the well-known series/parallel bounds on the total capacitance of a binary mixture, while tighter bounds are obtained from results of Hashin and Shtrikman for isotropic mixtures.<
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