Measurement of the surface resistance of a metallic thin film at a wavelength of 10.6 mu m

A quasi-optical method for measuring the surface resistance of a metallic thin film is described. This resistance is derived from measurements of the forward tilt of a surface wave which propagates on the thin metallic film. In order to verify the results, ellipsometry is used. The measurements were made at a wavelength of 10.6 mu m at ambient temperature. The surface resistance of an Au film was measured to be 16 times higher than the classical surface resistance.<
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