Integrated Optical Six-Port Reflectometer in Silicon on Insulator

The six-port reflectometer technique enables simple and accurate measurement of optical reflection coefficients in both magnitude and phase. The reflection coefficient is computed from four power measurements of linear combinations of the waves incident and reflected from the device under test. While the six-port technique is very successful at microwave frequencies and conceptually related to coherent optical phase diversity receivers, no optical implementations have been reported so far. In this paper, we present an experimental characterization of an optical six-port reflectometer composed of three multimode interference couplers, fabricated with a single etch step in silicon on insulator. Measurements are performed using a novel technique with a simple setup. The six-port combines the incident and reflected waves with magnitude and phase errors less than plusmn0.5 dB and plusmn6deg in the 1485-1575 nm band.